Atomic resolution analytical microscopy
- P.E. Batson
- 2000
- IBM J. Res. Dev
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89 results for Philip E. Batson
Atomic resolution EELS analysis of a misfit dislocation at a GeSi/Si interface
- P.E. Batson
- 1999
- Physica B: Condensed Matter
Measurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics
- David A. Muller
- Philip E. Batson
- 1998
- Physical Review B - CMMP
Bandstructure Near Misfit Dislocations in Si Quantum Wells
- P.E. Batson
- 1998
- Microscopy and Microanalysis
Structure, chemistry and bonding at grain boundaries in Ni3Al - I. The role of boron in ductilizing grain boundaries
- D.A. Muller
- S. Subramanian
- et al.
- 1996
- Acta Materialia
Atomic resolution electronic structure in silicon-based semiconductors
- P.E. Batson
- 1996
- Journal of Electron Microscopy
The structure, bonding and chemistry of grain boundaries in Ni3Al
- S. Subramanian
- D.A. Muller
- et al.
- 1995
- Materials Science and Engineering A
Near‐atomic‐resolution EELS in silicon‐germanium alloys
- P.E. BATSON
- 1995
- Journal of Microscopy
Conduction bandstructure in strained silicon by spatially resolved electron energy loss spectroscopy
- P.E. Batson
- 1995
- Ultramicroscopy
Semiclassical model for the inelastic scattering probability of electrons traveling parallel to four dielectric layers
- Marek A. Turowski
- Thomas F. Kelly
- et al.
- 1994
- Journal of Applied Physics