Characterizing fluorocarbon assisted atomic layer etching of Si using cyclic Ar/C4F8 and Ar/CHF3 plasmaDominik MetzlerChen Liet al.2016Journal of Chemical Physics
Selective atomic layer etching of HfO2 over silicon by precursor and substrate-dependent selective depositionKang Yi LinChen Liet al.2020JVSTA
Achieving ultrahigh etching selectivity of SiO2 over Si3N4 and Si in atomic layer etching by exploiting chemistry of complex hydrofluorocarbon precursorsKang Yi LinChen Liet al.2018JVSTA
Fluorocarbon assisted atomic layer etching of SiO2 and Si using cyclic Ar/C4F8 and Ar/CHF3 plasmaDominik MetzlerChen Liet al.2016JVSTA
Application of cyclic fluorocarbon/argon discharges to device patterningDominik MetzlerKishore Uppireddiet al.2016JVSTA