Tantalum silicide films deposited by dc sputtering
- J. Angilello
- J.E.E. Baglin
- et al.
- 1981
- Journal of Electronic Materials
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60 results for Armin Segmüller
High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate
- M. Pomerantz
- Armin Segmüller
- 1980
- Thin Solid Films
Thermal strain in lead thin films IV: Effects of multiple cycling to 4.2 K
- M. Murakami
- J. Angelillo
- et al.
- 1979
- Thin Solid Films
X-ray diffraction measurement of the Jahn-Teller distortion in TmVO4
- Armin Segmüller
- R.L. Melcher
- et al.
- 1974
- Solid State Communications
Measurement of the liquid-structure factor of supercooled gallium and mercury
- D.G. Carlson
- J. Feder
- et al.
- 1974
- Physical Review A
Observation of X-ray interferences on thin films of amorphous silicon
- Armin Segmüller
- 1973
- Thin Solid Films
The Effect of Growth Orientation on the Crystal Perfection of Horizontal Bridgman Grown GaAs
- T.S. Plaskett
- J. Woodall
- et al.
- 1971
- JES
Internal strain in elastically strained germanium and silicon - II. General relations, transverse and longitudinal case
- A. Segmüller
- H.R. Neyer
- 1965
- Physik der Kondensierten Materie
Internal strain in elastically strained germanium and silicon - I. Longitudinal case
- Armin Segmüller
- 1964
- Physik der Kondensierten Materie
Observation of bond-bending in strained germanium
- A. Segmüller
- 1963
- Physics Letters