Interfacial Reaction During Metallization of Cured Polyimide: An XPS Study
- N.J. Chou
- C.H. Tang
- 1984
- JVSTA
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29 results for N.J. Chou
On the phenomenological model of preferred sputtering for SIMS and Auger profiling: A critical analysis
- N.J. Chou
- M.W. Shafer
- 1980
- Surface Science
An internal calibration technique for pseudobinary systems by auger electron spectroscopy
- R. Hammer
- N.J. Chou
- et al.
- 1976
- Journal of Electronic Materials
Auger and ellipsometric studies of ultra-thin PbO growth on lead
- N.J. Chou
- J.M. Eldridge
- et al.
- 1973
- Journal of Electronic Materials
D.c conduction in sio2 films at elevated temperatures
- N.J. Chou
- 1972
- Journal of Electronic Materials
Effects of Insulator Thickness Fluctuations on MNOS Charge Storage Characteristics
- N.J. Chou
- Joseph A. Aboaf
- et al.
- 1972
- IEEE T-ED
Charge storage phenomena in Al-γ-Al2O3-SiO2-Si structures
- N.J. Chou
- P.J. Tsang
- 1971
- Metallurgical Transactions
Application of Triangular Voltage Sweep Method to Mobile Charge Studies in MOS Structures
- N.J. Chou
- 1971
- JES
Effects of Material and Processing Parameters on the Dielectric Strength of Thermally Grown Si02 Films
- N.J. Chou
- J.M. Eldridge
- 1970
- JES