Generalized rotating-compensator ellipsometry
- P.S. Hauge
- 1976
- Surface Science
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17 results for P.S. Hauge
Automated Mueller matrix ellipsometry
- P.S. Hauge
- 1976
- Optics Communications
Characterization of Positive Photoresist
- Frederick H. Dill
- William P. Hornberger
- et al.
- 1975
- IEEE T-ED
A rotating-compensator fourier ellipsometer
- P.S. Hauge
- F.H. Dill
- 1975
- Optics Communications
Static Negative Resistance in Gunn Effect Materials with Field-Dependent Carrier Diffusion
- P.S. Hauge
- 1971
- IEEE T-ED
Microwave Measurement of the Velocity-Field Characteristic of GaAs
- N. Braslau
- P.S. Hauge
- 1970
- IEEE T-ED
Domain Velocity in Semiconductors with Field-Dependent Carrier Diffusion
- P.S. Hauge
- 1970
- IEEE T-ED