Thermal stability of Si1-xCx/Si strained layer superlattices
- M.S. Goorsky
- Subramanian S. Iyer
- et al.
- 1992
- Applied Physics Letters
Publications
Date
Featured collections
Popular topics
22 results for Joseph Angilello
Preparation And Some Properties Of Sputtered Co/U-As Multilayers
- T.S. Plaskett
- P. Fumagalli
- et al.
- 1992
- IEEE Transactions on Magnetics
Epitaxy of (100) Cu on (100) Si by evaporation near room temperatures: In-plane epitaxial relation and channeling analysis
- Chin-An Chang
- Joyce C. Liu
- et al.
- 1990
- Applied Physics Letters
Crystallization kinetics of amorphous NiSix films
- R.D. Thompson
- J. Angilello
- et al.
- 1990
- Thin Solid Films
Lanthanide gallate perovskite-type substrates for epitaxial, high-Tc superconducting Ba2YCu3O7-δ films
- E.A. Giess
- R.L. Sandstrom
- et al.
- 1990
- IBM J. Res. Dev
Properties of diamond structure SnGe films grown by molecular beam epitaxy
- Alex Harwit
- P.R. Pukite
- et al.
- 1990
- Thin Solid Films
Oriented growth of ultrathin tungsten films on sapphire substrates
- J.H. Souk
- Armin Segmüller
- et al.
- 1987
- Journal of Applied Physics
Stresses and radiation damage in Ar+ and Ti+ ion-implanted silicon
- P.B. Madakson
- J. Angilello
- 1987
- Journal of Applied Physics
Thermal stability of Pb-alloy Josephson junction electrode materials. VII. Concentration range of single ε-phase Pb-Bi films used in counterelectrodes
- Masanori Murakami
- H.-C.W. Huang
- et al.
- 1983
- Journal of Applied Physics
Tantalum silicide films deposited by dc sputtering
- J. Angilello
- J.E.E. Baglin
- et al.
- 1981
- Journal of Electronic Materials