Properties of diamond structure SnGe films grown by molecular beam epitaxy
- Alex Harwit
- P.R. Pukite
- et al.
- 1990
- Thin Solid Films
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22 results for Joseph Angilello
Lanthanide gallate perovskite-type substrates for epitaxial, high-Tc superconducting Ba2YCu3O7-δ films
- E.A. Giess
- R.L. Sandstrom
- et al.
- 1990
- IBM J. Res. Dev
Lattice compression from conduction electrons in heavily doped Si:as
- G.S. Cargill III
- J. Angilello III
- et al.
- 1988
- Physical Review Letters
Oriented growth of ultrathin tungsten films on sapphire substrates
- J.H. Souk
- Armin Segmüller
- et al.
- 1987
- Journal of Applied Physics
Stresses and radiation damage in Ar+ and Ti+ ion-implanted silicon
- P.B. Madakson
- J. Angilello
- 1987
- Journal of Applied Physics
Disorder in Al-Li-Cu and Al-Mn-Si icosahedral alloys
- P.A. Heiney
- P.A. Bancel
- et al.
- 1987
- Science
AUTOMATED MICRODENSITOMETER FOR DIGITIZING ASTRONOMICAL PLATES.
- J. Angilello
- Wei-Hwan Chiang
- et al.
- 1983
- Astronomical Microdensitometry Conference 1983
Thermal stability of Pb-alloy Josephson junction electrode materials. VII. Concentration range of single ε-phase Pb-Bi films used in counterelectrodes
- Masanori Murakami
- H.-C.W. Huang
- et al.
- 1983
- Journal of Applied Physics
Tantalum silicide films deposited by dc sputtering
- J. Angilello
- J.E.E. Baglin
- et al.
- 1981
- Journal of Electronic Materials
Flash X-ray microscopy
- R.A. McCorkle
- J. Angilello
- et al.
- 1979
- Science