Lattice compression from conduction electrons in heavily doped Si:as
- G.S. Cargill III
- J. Angilello III
- et al.
- 1988
- Physical Review Letters
Publications
Date
Featured collections
Popular topics
22 results for Joseph Angilello
Disorder in Al-Li-Cu and Al-Mn-Si icosahedral alloys
- P.A. Heiney
- P.A. Bancel
- et al.
- 1987
- Science
Flash X-ray microscopy
- R.A. McCorkle
- J. Angilello
- et al.
- 1979
- Science
AUTOMATED MICRODENSITOMETER FOR DIGITIZING ASTRONOMICAL PLATES.
- J. Angilello
- Wei-Hwan Chiang
- et al.
- 1983
- Astronomical Microdensitometry Conference 1983
Preparation and Characterization of Ruthenium Dioxide Crystals
- M.W. Shafer
- R.A. Figat
- et al.
- 2019
- JES
A Viscous Flow Model to Explain the Appearance of High Density Thermal Si02 at Low Oxidation Temperatures
- E. Tierney
- J. Angilello
- 2019
- JES
Etch pits and dislocations in {100} GaAs wafers
- J. Angilello
- R.M. Potemski
- et al.
- 2008
- Journal of Applied Physics
Contact reaction between Si and Pd-W alloy films
- J.O. Olowolafe
- K.N. Tu
- et al.
- 2008
- Journal of Applied Physics
Electromechanical feedback control for lang topography
- Joseph Angilello
- Clinton Wood
- 2003
- Review of Scientific Instruments
The interpretation of dislocation contrast in x-ray topographs of GaAs 1-x Px
- S. Mader
- A.E. Blakeslee
- et al.
- 2003
- Journal of Applied Physics