Technique for determining concentration profiles of boron impurities in substrates
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Journal of Applied Physics
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3 results for G.W. Cole
Discovery of anomalous base regions in transistors
- J.F. Ziegler
- G.W. Cole
- et al.
- 2003
- Applied Physics Letters
Boron atom distributions in ion-implanted silicon by the (n,4He) nuclear reaction
- J.F. Ziegler
- B.L. Crowder
- et al.
- 2003
- Applied Physics Letters