Reliability and fracture of metal-polymer structures with fine-line geometries
- Shih-Liang Chiu
- Y.H. Jeng
- et al.
- 1990
- ISCAS 1990
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118 results for Paul S. Ho
NEW TECHNIQUE FOR FAILURE ANALYSIS: CROSS-SECTIONAL TRANSMISSION ELECTRON MICROSCOPY OF DEVICES.
- F.K. LeGoues
- P.S. Ho
- 1985
- VMIC 1985
STRESS DEVELOPMENT IN POLYMER COATINGS DURING THERMAL CYCLING - A BENDING - BEAM APPROACH.
- C.-K. Hu
- Ho-Ming Tong
- et al.
- 1984
- VMIC 1984
TEMPERATURE DEPENDENCE OF STRESSES IN Ti, Cr, AND Cu THIN FILMS.
- C.-K. Hu
- D. Gupta
- et al.
- 1984
- VMIC 1984
BASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
SOME BASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
ELECTROMIGRATION STUDIES OF Al-INTERMETALLIC STRUCTURES.
- P.S. Ho
- T. Kwok
- et al.
- 1983
- SSDM 1983
BASIC PROBLEMS IN INTERCONNECT METALLIZATION FOR VLSI APPLICATIONS.
- P.S. Ho
- 1982
- Vacuum Congress - Conference on Solid Surfaces 1982
Thin films and interfaces
- P.S. Ho
- K.N. Tu
- 2013
- MRS Bulletin
Nonlinear propagation of void front during electromigration in alloy films
- P.S. Ho
- J.K. Howard
- 2008
- Applied Physics Letters