Chemical reactions at Pt/oxide/Si and Ti/oxide/Si interfaces
- M. Liehr
- F.K. LeGoues
- et al.
- 1985
- JVSTA
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118 results for Paul S. Ho
BASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
SOME BASIC PROBLEMS IN VLSI INTERCONNECT.
- P.S. Ho
- 1984
- ECS Meeting 1984
Metal-amorphous silicon-silicon tunnel rectifier
- E.S. Yang
- Q.H. Hua
- et al.
- 1984
- Applied Physics Letters
ELECTROMIGRATION STUDIES OF Al-INTERMETALLIC STRUCTURES.
- P.S. Ho
- T. Kwok
- et al.
- 1983
- SSDM 1983
Chemical and structural aspects of reaction at the Ti/Si interface
- R. Butz
- G.W. Rubloff
- et al.
- 1984
- Physical Review B
Computer simulation of vacancy migration in a fcc tilt boundary
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Surface Science
Molecular-dynamics studies of grain-boundary diffusion. I. Structural properties and mobility of point defects
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Physical Review B
Molecular-dynamics studies of grain-boundary diffusion. II. Vacancy migration, diffusion mechanism, and kinetics
- Thomas Kwok
- Paul S. Ho
- et al.
- 1984
- Physical Review B
Chemical Bonding at the Polyimide Surface
- P.O. Hahn
- G.W. Rubloff
- et al.
- 1984
- JVSTA