Publications

118 results for Paul S. Ho

Summary Abstract: High resolution synchrotron photoemission study of silicon-metal interfaces
- - P.S. Ho
- 1985
- JVSTA
SOME BASIC PROBLEMS IN VLSI INTERCONNECT.
- - P.S. Ho
- 1984
- ECS Meeting 1984
BASIC PROBLEMS IN VLSI INTERCONNECT.
- - P.S. Ho
- 1984
- ECS Meeting 1984
Metal-amorphous silicon-silicon tunnel rectifier
- - E.S. Yang
  - Q.H. Hua
  - et al.
- 1984
- Applied Physics Letters
ELECTROMIGRATION STUDIES OF Al-INTERMETALLIC STRUCTURES.
- - P.S. Ho
  - T. Kwok
  - et al.
- 1983
- SSDM 1983
Chemical and structural aspects of reaction at the Ti/Si interface
- - R. Butz
  - G.W. Rubloff
  - et al.
- 1984
- Physical Review B
Computer simulation of vacancy migration in a fcc tilt boundary
- - Thomas Kwok
  - Paul S. Ho
  - et al.
- 1984
- Surface Science
Molecular-dynamics studies of grain-boundary diffusion. I. Structural properties and mobility of point defects
- - Thomas Kwok
  - Paul S. Ho
  - et al.
- 1984
- Physical Review B
Molecular-dynamics studies of grain-boundary diffusion. II. Vacancy migration, diffusion mechanism, and kinetics
- - Thomas Kwok
  - Paul S. Ho
  - et al.
- 1984
- Physical Review B
Chemical Bonding at the Polyimide Surface
- - P.O. Hahn
  - G.W. Rubloff
  - et al.
- 1984
- JVSTA