Hydrogen migration under avalanche injection of electrons in Si metal-oxide-semiconductor capacitors
- R. Gale
- F.J. Feigl
- et al.
- 1983
- Journal of Applied Physics
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31 results for D.R. Young
The effects of water on oxide and interface trapped charge generation in thermal SiO2 films
- F.J. Feigl
- D.R. Young
- et al.
- 1981
- Journal of Applied Physics
Identification of electron traps in thermal silicon dioxide films
- A. Hartstein
- D.R. Young
- 1981
- Applied Physics Letters
Reduction of electron trapping in silicon dioxide by high-temperature nitrogen anneal
- S.K. Lai
- D.R. Young
- et al.
- 1981
- Journal of Applied Physics
Characterization of electron traps in SiO2 as influenced by processing parameters
- D.R. Young
- 1981
- Journal of Applied Physics
Effects of avalanche injection of electrons into silicon dioxide - Generation of fast and slow interface states
- S.K. Lai
- D.R. Young
- 1981
- Journal of Applied Physics
Detection of impurities on silicon surfaces
- D.J. DiMaria
- W. Reuter
- et al.
- 1981
- Journal of Applied Physics
The electron trapping behavior of silicon dioxide with ion implanted aluminum
- D.R. Young
- D.J. DiMaria
- et al.
- 1977
- Journal of Electronic Materials
Use of photocurrent-voltage characteristics of MOS structures to determine insulator bulk trapped charge densities and centroids
- D.J. DiMaria
- Z.A. Weinberg
- et al.
- 1977
- Journal of Electronic Materials
Avalanche injection of holes into SiO2
- J.M. Aitken
- D.R. Young
- 1977
- IEEE TNS