Thermal oxidation of silicon: New experimental results and modelsEugene A. IreneR. Ghez1987Applied Surface Science
Hot electrons in silicon dioxide: Ballistic to steady-state transportD.J. DiMariaM.V. Fischetti1987Applied Surface Science
Charge trapping in n-AlxGa1-xAs "insulators" and related device instabilitiesT.N. TheisB.D. Parker1987Applied Surface Science