Unifying the Concepts of Offset Voltage and Common Mode Rejection RatioRichard C. Jaeger1976IEEE JSSC
High Sensitivity Charge Transfer Sense AmplifierLawrence G. HellerDominic P. Spampinatoet al.1976IEEE JSSC
Special Correspondence Effect of Randomness in the Distribution of Impurity Ions on FET Thresholds in Integrated ElectronicsRobert W. Keyes1975IEEE JSSC
An Experimental Multiplier Circuit Based on Superconducting Josephson DevicesDennis J. Herrell1975IEEE JSSC
A Subnanosecond Josephson Tunneling Memory Cell with Nondestructive ReadoutHans H. Zappe1975IEEE JSSC