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Al Coverage of Surface Steps at SiO2 Insulated Polycrystalline Si Boundaries: Al Evaporation in Vacuum and Low Pressure ArV.J. SilvestriV.L. Rideoutet al.2019JES
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Effect of CO on the Low Temperature Diffusion of Cr and Si Through Thin Gold FilmsChin-An Chang2019JES
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The Dependence of the Memory Effect in ZnS:Mn A-C Thin Film Electroluminescence on Mn DistributionV. MarrelloA.A. Onton2019JES
Electrochemical Test to Evaluate Passivation Layers: Overcoats of Si in InkM.H. LeeJ.M. Eldridgeet al.2019JES