Temperature dependence of the reflectivity of silicon with surface oxide at wavelengths of 633 and 1047 nm
- J. Heller
- J.W. Bartha
- et al.
- 1999
- Applied Physics Letters
Publications
2351 results at Applied Physics Letters
Variable sample temperature scanning superconducting quantum interference device microscope
- J.R. Kirtley
- C.C. Tsuei
- et al.
- 1999
- Applied Physics Letters
Exchange-biased magnetic tunnel junctions: Dependence of offset field on junction width
- K.-S. Moon
- R.E. Fontana Jr.
- et al.
- 1999
- Applied Physics Letters
Quantum constraints on technological superconductors
- J.R. Thompson
- J.G. Ossandon
- et al.
- 1999
- Applied Physics Letters
Electromigration path in Cu thin-film lines
- C.-K. Hu
- R. Rosenberg
- et al.
- 1999
- Applied Physics Letters
Thickness-dependent magnetotransport in ultrathin manganite films
- J.Z. Sun
- D.W. Abraham
- et al.
- 1999
- Applied Physics Letters
Atomic force microscopy of work functions on the nanometer scale
- M.P. O'Boyle
- T.T. Hwang
- et al.
- 1999
- Applied Physics Letters
Contact resistance of carbon nanotubes
- 1999
- Applied Physics Letters
Doppler broadening positron annihilation spectroscopy: A technique for measuring open-volume defects in silsesquioxane spin-on glass films
- Mihail P. Petkov
- Marc H. Weer
- et al.
- 1999
- Applied Physics Letters
Technique for producing highly planar Si/SiO0.64Ge0.36/Si metal-oxide-semiconductor field effect transistor channels
- T.J. Grasby
- C.P. Parry
- et al.
- 1999
- Applied Physics Letters