Summary Abstract: High resolution synchrotron photoemission study of silicon-metal interfacesP.S. Ho1985JVSTA
Effect of ion bombardment during deposition on the x-ray microstructure of thin silver filmsT.C. HuangG. Limet al.1985JVSTA
Reactive sputtering of copper and silicon near the sputtering thresholdT.M. MayerJ.M.E. Harperet al.1985JVSTA
The metal-insulator transition in magnetic semiconductors: Transport in Gd-xvxS4S. von MolnárJ. Flouquetet al.1985Solid-State Electronics
Summary Abstract: Comparison between the adsorption of PH3 and B2H6 on Si surfaces as related to the CVD of SiM.L. YuD.J. Vitkavageet al.1985JVSTA
Stress modification of WSi2.2 films by concurrent low energy ion bombardment during alloy evaporationD.S. YeeJ. Floroet al.1985JVSTA
Properties and Microelectronic Applications of Thin Films of Refractory Metal NitridesMarc Wittmer1985JVSTA