Hot electron transport in SiO2 probed with a scanning tunnel microscope
- R. Ludeke
- A. Bauer
- et al.
- 1995
- Applied Physics Letters
Publications
2351 results at Applied Physics Letters
The microstructural stability of Al(Cu) lines during electromigration
- T.M. Shaw
- C.-K. Hu
- et al.
- 1995
- Applied Physics Letters
Solid state ionic polishing of diamond
- J.E. Yehoda
- J.J. Cuomo
- 1995
- Applied Physics Letters
Polymeric electro-optic Mach-Zehnder switches
- J.I. Thackara
- J.C. Chon
- et al.
- 1995
- Applied Physics Letters
Influence of misfit dislocations on the surface morphology of Si1-xGex films
- M.A. Lutz
- R.M. Feenstra
- et al.
- 1995
- Applied Physics Letters
Across wafer etch rate uniformity in a high density plasma reactor: Experiment and modeling
- M. Surendra
- C.R. Guarnieri
- et al.
- 1995
- Applied Physics Letters
Transport and magnetic properties of in situ grown thin-film La-Y-Ca-Mn-O
- J.Z. Sun
- L. Krusin-Elbaum
- et al.
- 1995
- Applied Physics Letters
Formation of Al-Cu via/interconnect by low-pressure collimated sputtering
- R.V. Joshi
- H.M. Dalal
- et al.
- 1995
- Applied Physics Letters
Enhancement of transport critical current densities at 75 K in(Bi,Pb) 2Sr2Ca2Cu3Oy /Ag tapes by means of fission tracks from irradiation by 0.8 GeV protons
- H. Safar
- J.H. Cho
- et al.
- 1995
- Applied Physics Letters
In situ x-ray diffraction analysis of the C49-C54 titanium silicide phase transformation in narrow lines
- R.A. Roy
- L. Clevenger
- et al.
- 1995
- Applied Physics Letters