Effect of excess silicon on behavior of LPCVD WSix films on silicon
- R.V. Joshi
- Young H. Kim
- et al.
- 1988
- Thin Solid Films
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Amorphous alloy formation by solid state reaction
- K.N. Tu
- G.V. Chandrashekhar
- et al.
- 1988
- Thin Solid Films
Analysis of cobalt-doped iron oxide thin films by synchrotron radiation
- T.C. Huang
- M. Toney
- et al.
- 1987
- Thin Solid Films
Relationship between substrate bias and microstructure in magnetron-sputtered AlCu films
- T. Lin
- K.Y. Ahn
- et al.
- 1987
- Thin Solid Films
Characterization of epitaxial films by grazing-incidence X-ray diffraction
- Armin Segmüller
- 1987
- Thin Solid Films
The effect of ultrathin selenium overcoat on the stability of tellurium-based optical recording media
- W.-Y. Lee
- 1987
- Thin Solid Films
Transport in refractory metals and their interaction with SiO2: Comparison of tungsten and molybdenum
- L. Krusin-Elbaum
- M.O. Aboelfotoh
- et al.
- 1987
- Thin Solid Films
Effects of substrate temperature on copper distribution, resistivity, and microstructure in magnetron-sputtered Al-Cu films
- K.Y. Ahn
- T. Lin
- et al.
- 1987
- Thin Solid Films
A comparison of tungsten film deposition techniques for very large scale integration technology
- K.Y. Ahn
- 1987
- Thin Solid Films
Characterization of the structure of Langmuir-Blodgett films by short-wavelength radiations
- M. Pomerantz
- 1987
- Thin Solid Films