History dependence of output characteristics of silicon-on-insulator (SOI) MOSFET's
- Keith A. Jenkins
- J.Y.-C. Sun
- et al.
- 1996
- IEEE Electron Device Letters
Publications
Date
Featured collections
Popular topics
307 results at IEEE Electron Device Letters
A Highly Reliable Low Temperature Al-Cu Line/Via Metallization for Sub-Half Micrometer CMOS
- R.V. Joshi
- H. Dalai
- et al.
- 1995
- IEEE Electron Device Letters
Hole Trapping, Substrate Currents, and Breakdown in Thin Silicon Dioxide Films
- D.J. Di Maria
- 1995
- IEEE Electron Device Letters
On “Effective Channel Length” in 0.1-µm MOSFET's
- Yuan Taur
- Yuh-Jier Mii
- et al.
- 1995
- IEEE Electron Device Letters
On the Transient Operation of Partially Depleted SOI NMOSFET's
- Jacques Gautier
- Jack Y.-C. Sun
- 1995
- IEEE Electron Device Letters
Measurement of I—V Curves of Silicon-on-Insulator (SOI) MOSFET's Without Self-Heating
- Keith A. Jenkins
- J.Y.-C. Sun
- 1995
- IEEE Electron Device Letters
Random Telegraph Signals in Accumulation-Mode SOI/nMOSFET
- Ming-Horn Tsai
- Tso-Ping Ma
- et al.
- 1994
- IEEE Electron Device Letters
Anomalous Narrow Channel Effect in Trench-Isolated Buried-Channel P-MOSFET‘s
- J.A. Mandelman
- J. Alsmeier
- 1994
- IEEE Electron Device Letters
SiGe pMOSFET's with Gate Oxide Fabricated by Microwave Electron Cyclotron Resonance Plasma Processing
- P.W. Li
- E.S. Yang
- et al.
- 1994
- IEEE Electron Device Letters
Transistor Performance and Electron Transport Properties of High Performance InAs Quantum-Well FET's
- John K. Zahurak
- Stephen A. Rishton
- et al.
- 1994
- IEEE Electron Device Letters