Resistive Random Access Memory Filament Visualization and Characterization Using Photon Emission Microscopy
- Franco Stellari
- Ernest Y. Wu
- et al.
- 2021
- IEEE Electron Device Letters
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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306 results at IEEE Electron Device Letters
Accumulation-based computing using phase-change memories with FET access devices
- Peiman Hosseini
- Abu Sebastian
- et al.
- 2015
- IEEE Electron Device Letters
Accurate Modeling of Cryogenic Temperature Effects in 10-nm Bulk CMOS FinFETs Using the BSIM-CMG Model
- Sujit K. Singh
- Sumreti Gupta
- et al.
- 2022
- IEEE Electron Device Letters
Measurement of Self-Heating of High-Frequency CMOS Clock Buffers
- Keith A. Jenkins
- Alan J. Weger
- 2022
- IEEE Electron Device Letters
Resistive Memory Process Optimization for High Resistance Switching Toward Scalable Analog Compute Technology for Deep Learning
- Youngseok Kim
- Soon-Cheon Seo
- et al.
- 2021
- IEEE Electron Device Letters
Ultra-Low Noise Schottky Junction Tri-Gate Silicon Nanowire FET on Bonded Silicon-on-Insulator Substrate
- Yingtao Yu
- Si Chen
- et al.
- 2021
- IEEE Electron Device Letters
A Simulation Study on Minimizing Threshold Voltage Variability by Optimizing Oxygen Vacancy Concentration under Metal Gate Granularity
- Madhu Padmanabha Sumangala
- Ahish Shylendra
- et al.
- 2020
- IEEE Electron Device Letters
Time-Delay Encoded Image Recognition in a Network of Resistively Coupled VO on Si Oscillators
- Elisabetta Corti
- A. Khanna
- et al.
- 2020
- IEEE Electron Device Letters
Effects of Substrate Bias on Low-Frequency Noise in Lateral Bipolar Transistors Fabricated on Silicon-on-Insulator Substrate
- Qitao Hu
- Si Chen
- et al.
- 2020
- IEEE Electron Device Letters
Exploring the Limits of Cobalt Liner Thickness in Advanced Copper Interconnects
- Nicholas A. Lanzillo
- Kisik Choi
- et al.
- 2019
- IEEE Electron Device Letters