Measurement of ultrafast hot-carrier relaxation in silicon by thin-film-enhanced, time-resolved reflectivity
- F.E. Doany
- D. Grischkowsky
- 1988
- Applied Physics Letters
Publications
2351 results at Applied Physics Letters
Reaction kinetics of nickel/silicon multilayer films
- L. Clevenger
- C.V. Thompson
- et al.
- 1988
- Applied Physics Letters
Neutral E' centers in microwave downstream plasma-enhanced chemical-vapor-deposited silicon dioxide
- W.L. Warren
- P. Lenahan
- et al.
- 1988
- Applied Physics Letters
High-resolution capacitance measurement and potentiometry by force microscopy
- Yves Martin
- David W. Abraham
- et al.
- 1988
- Applied Physics Letters
Contact resistance to undoped and phosphorus-doped hydrogenated amorphous silicon films
- Jerzy Kanicki
- 1988
- Applied Physics Letters
Defect formation in SiO2/Si(100) by metal diffusion and reaction
- M. Liehr
- H. Dallaporta
- et al.
- 1988
- Applied Physics Letters
Photothermal absorption microprobe: Infrared spectroscopy of a single 1 μm organic particle
- Marc A. Taubenblatt
- 1988
- Applied Physics Letters
Interaction of a polycrystalline silicon/SiO2/silicon substrate under thermal/electrical fields
- T.C. Chou
- K.N. Tu
- 1988
- Applied Physics Letters
Thin-film YBaCuO superconductors formed by Cu/BaO/Y2O 3 layer structures
- Chin-An Chang
- C.C. Tsuei
- et al.
- 1988
- Applied Physics Letters
High conductivity polycrystalline silicon obtained by molecular beam deposition
- S.L. Delage
- S.-J. Jeng
- et al.
- 1988
- Applied Physics Letters