Measurements and simulation of avalanche breakdown in advanced Si bipolar transistors
- E. Zanoni
- E.F. Crabbe
- et al.
- 1992
- IEDM 1992
Publications
Date
Featured collections
Popular topics
12 results at IEDM 1992
Gate-current injection and surface impact ionization in MOSFET's with a gate induced virtual drain
- Hon-Sum Wong
- 1992
- IEDM 1992