SENSITIVE MASS MEASUREMENT AT THE METAL/LIQUID INTERFACE.
- K.K. Kanazawa
- Owen R. Melroy
- et al.
- 1983
- ECS Meeting 1983
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22 results at ECS Meeting 1983
INTERACTION BETWEEN Ti AND SiO//2.
- C.-Y. Ting
- M. Wittmer
- et al.
- 1983
- ECS Meeting 1983
PROPERTIES OF AMORPHOUS TANTALUM PENTOXIDE THIN FILMS ON SILICON.
- G.S. Oehrlein
- 1983
- ECS Meeting 1983
ADSORPTION OF CN** minus ON VARIOUS METAL ELECTRODES AS SEEN BY POLARIZATION MODULATED FT IRRAS.
- H. Seki
- K. Kunimatsu
- et al.
- 1983
- ECS Meeting 1983
AMBIENT GAS EFFECTS ON THE REACTION OF TITANIUM WITH SILICON.
- Subramanian S. Iyer
- C.-Y. Ting
- et al.
- 1983
- ECS Meeting 1983
COMPARATIVE MEASUREMENTS OF PLASMA O ATOM CONCENTRATION BY SIMULTANEOUS TWO-PHOTON LASER-INDUCED FLUORESCENCE AND OPTICAL EMISSION ACTINOMETRY.
- K.L. Saenger
- R.E. Walkup
- et al.
- 1983
- ECS Meeting 1983
ELECTRODE/ELECTROLYTE INTERPHASE STUDY USING POLARIZATION MODULATED FTIR REFLECTION ABSORPTION SPECTROSCOPY.
- K. Kunimatsu
- H. Seki
- et al.
- 1983
- ECS Meeting 1983
POINT DEFECTS AND DIFFUSION PROCESSES IN SILICON.
- T.Y. Tan
- U. Gosele
- 1983
- ECS Meeting 1983
SHORT-TIME ANNEALING OF DRY-ETCHING DAMAGE.
- C.M. Ransom
- T.O. Sedgwick
- et al.
- 1983
- ECS Meeting 1983
APPLICATION OF THE MIXED POTENTIAL THEORY AND THE INTERDEPENDENCE OF PARTIAL REACTIONS IN ELECTROLESS COPPER DEPOSITION.
- P. Bindra
- Allan David
- et al.
- 1983
- ECS Meeting 1983