Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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14 results at IRPS 2011
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
- Ulrike Kindereit
- Oana-Mihaela Mutihac
- et al.
- 2011
- IRPS 2011
Impact of source/drain contact and gate finger spacing on the RF reliability of 45-nm RF nMOSFETs
- Rajan Arora
- Sachin Seth
- et al.
- 2011
- IRPS 2011