Invasion percolation model for abnormal TDDB characteristic of ULK dielectrics with Cu interconnect at advanced technology nodes
- F. Chen
- Michael Shinosky
- et al.
- 2011
- IRPS 2011
Publications
Date
Featured collections
Popular topics
14 results at IRPS 2011
Correlation of Id- and Ig-random telegraph noise to positive bias temperature instability in scaled high-κ/metal gate n-type MOSFETs
- Chia-Yu Chen
- Qiushi Ran
- et al.
- 2011
- IRPS 2011
PBTI under dynamic stress: From a single defect point of view
- K. Zhao
- J.H. Stathis
- et al.
- 2011
- IRPS 2011
Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses
- Frederic Monsieur
- Eduard Cartier
- et al.
- 2011
- IRPS 2011
A robust reliability methodology for accurately predicting Bias Temperature Instability induced circuit performance degradation in HKMG CMOS
- D.P. Ioannou
- K. Zhao
- et al.
- 2011
- IRPS 2011
Post-breakdown statistics and acceleration characteristics in high-K dielectric stacks
- Ernest Wu
- Jordi Sune
- et al.
- 2011
- IRPS 2011
Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies
- Jae-Joon Kim
- Barry P. Linder
- et al.
- 2011
- IRPS 2011
Bias Temperature Instability model for digital circuits - Predicting instantaneous FET response
- Aditya Bansal
- Kai Zhao
- et al.
- 2011
- IRPS 2011
Spectral resolution of photon emission from SiGe:C heterojunction bipolar transistors (HBTs)
- Ulrike Kindereit
- Oana-Mihaela Mutihac
- et al.
- 2011
- IRPS 2011
Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing
- Jeffrey D. Wilkinson
- Brett M. Clark
- et al.
- 2011
- IRPS 2011