Effect of catalyst composition on Si nanowire growth kinetics
- S. Kodambaka
- J. Tersoff
- et al.
- 2009
- Microscopy and Microanalysis
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In-situ focused ion beam micropatterning of Ge islands
- M. Kammler
- R. Hull
- et al.
- 2003
- Microscopy and Microanalysis
Growth and stability of Bi films on Si(111) studied by leem
- G.E. Thayer
- J.T. Sadowski
- et al.
- 2003
- Microscopy and Microanalysis
High resolution spectrometer coupling to the sub-Å IBM STEM
- P.E. Batson
- 2003
- Microscopy and Microanalysis
TEM and atom probe microscopy in the development of magnetic multilayer nano-structures
- P. Rice
- T. Lin
- et al.
- 2003
- Microscopy and Microanalysis
Experience with the IBM sub-angstrom STEM
- P.E. Batson
- 2003
- Microscopy and Microanalysis
Sub-angstrom probe size in HADF-STEM at 120KV
- Philip Batson
- N. Dellby
- et al.
- 2002
- Microscopy and Microanalysis
Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)
- Oliver C. Wells
- 2002
- Microscopy and Microanalysis
In situ transmission electron microscopy of copper electrodeposition
- Frances M. Ross
- Mark J. Williamson
- et al.
- 2002
- Microscopy and Microanalysis
Metallic magnetic nanocrystals - Shapes, self-assembly and phase transformation
- Zhong Lin Wang
- Zurong Dai
- et al.
- 2002
- Microscopy and Microanalysis