Microscopy and Microanalysis

Paper

26 Jul 2009

Precision, double XTEM sample preparation of site specific Si nanowires

Abstract

No abstract available.

Related

Conference paper

Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance

Paper

Comparison of Cu electromigration lifetime in Cu interconnects coated with various caps

Conference paper

Effects of Al and Mn impurities on Cu electromigration

Paper

Evaluations and considerations for self-assembled monolayer field-effect transistors

View all publications