Microscopy and Microanalysis

Paper

26 Jul 2009

Precision, double XTEM sample preparation of site specific Si nanowires

Abstract

No abstract available.

Related

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Paper

Reduced electromigration of Cu wires by surface coating

Conference paper

Mechanisms for microstructure evolution in electroplated copper thin films

Conference paper

Measurements of carrier transport in MOSFETs with bottom-up nanowire channel as a function of the nanowire diameter

View all publications