L. Gignac, C.-K. Hu, et al.
Microelectronic Engineering
Paper
Precision, double XTEM sample preparation of site specific Si nanowires
Abstract
No abstract available.
Related
J.L. Hurd, K.P. Rodbell, et al.
Applied Physics Letters
Y.-H. Kim, C. Cabral Jr., et al.
IEDM 2005
C.-K. Hu, L. Gignac, et al.
JES