Quantifying work function differences using low-energy electron microscopy: The case of mixed-terminated strontium titanate
- J. Jobst
- Laurens M. Boers
- et al.
- 2019
- Ultramicroscopy
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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126 results at Ultramicroscopy
Measuring chromatic aberration in LEEM/PEEM
- Rudolf M. Tromp
- 2019
- Ultramicroscopy
Reprint of Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Space charge effects and aberrations on electron pulse compression in a spherical electrostatic capacitor
- Lei Yu
- Haibo Li
- et al.
- 2017
- Ultramicroscopy
Defocus in cathode lens instruments
- Rudolf M. Tromp
- M.S. Altman
- 2017
- Ultramicroscopy
Low-energy electron potentiometry
- J. Jobst
- Jaap Kautz
- et al.
- 2017
- Ultramicroscopy
Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources
- Weishi Wan
- Lei Yu
- et al.
- 2017
- Ultramicroscopy
An adjustable electron achromat for cathode lens microscopy
- Rudolf M. Tromp
- 2015
- Ultramicroscopy
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
- Daniël Geelen
- A. Thete
- et al.
- 2015
- Ultramicroscopy
Catadioptric aberration correction in cathode lens microscopy
- Rudolf M. Tromp
- 2015
- Ultramicroscopy