Publications

2357 results at Journal of Applied Physics

X-ray structures and magnetic properties of sputtered osmium-doped iron oxide thin films
- - G. Lim
  - T.C. Huang
  - et al.
- 1986
- Journal of Applied Physics
SiO₂-induced substrate current and its relation to positive charge in field-effect transistors
- - Z.A. Weinberg
  - M.V. Fischetti
  - et al.
- 1986
- Journal of Applied Physics
The measurement of effective complex refractive indices for selected metal silicides
- - R.D. Frampton
  - E.A. Irene
  - et al.
- 1986
- Journal of Applied Physics
Oxygen precipitation retardation and recovery phenomena in Czochralski silicon: Experimental observations, nuclei dissolution model, and relevancy with nucleation issues
- - T.Y. Tan
  - C.Y. Kung
- 1986
- Journal of Applied Physics
Cross-sectional transmission electron microscopy investigation of Ti/Si reaction on phosphorus-doped polycrystalline silicon gate
- - C.Y. Wong
  - F.S. Lai
  - et al.
- 1986
- Journal of Applied Physics
Ar ion laser-assisted chemical etching of molybdenum foils in air
- - G. Koren
- 1986
- Journal of Applied Physics
Comment on "Misfit stress in InGaAs/InP heteroepitaxial structures grown by vapor-phase epitaxy" (Journal of Applied Physics (1985) 57 (249))
- - I.C. Noyan
  - Armin Segmüller
- 1986
- Journal of Applied Physics
Electron heating studies in silicon dioxide: Low fields and thick films
- - D.J. DiMaria
  - M.V. Fischetti
  - et al.
- 1986
- Journal of Applied Physics
Titanium-tungsten contacts to silicon. II. Stability against aluminum penetration
- - S.E. Babcock
  - K.N. Tu
- 1986
- Journal of Applied Physics
Determination of the conduction-band discontinuity between in _0.53ga_0.47as/in_0.52al_0.48as using n⁺-ingaas/inalas/n^--ingaas capacitors
- - C.K. Peng
  - A. Ketterson
  - et al.
- 1986
- Journal of Applied Physics