M.I. Lutwyche, G. Cross, et al.
ISSCC 2000
Near-field optical-scanning (NFOS) microscopy or]] optical stethoscopy" provides images with resolution in the 20-nm range, i.e., a very small fraction of an optical wavelength. Scan images of metal films with fine structures presented in this paper convincingly demonstrate this resolution capability. Design of an NFOS microscope with tunnel distance regulation, its theoretical background, application potential, and limitations are discussed.
M.I. Lutwyche, G. Cross, et al.
ISSCC 2000
U. Dürig, J.K. Gimzewski, et al.
Physical Review Letters
U. Dürig
Applied Physics Letters
U. Dürig, O. Züger, et al.
Physical Review Letters