Waveform Measurements in High-Speed Silicon Bipolar Circuits Using a Picosecond Photoelectron Scanning Electron Microscope
- Paul May
- Jean-Marc Halbout
- et al.
- 1988
- IEEE T-ED
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Inherent and Stress-Induced Leakage in Heavily Doped Silicon Junctions
- Edward Hackbarth
- Denny Duan-Lee Tang
- 1988
- IEEE T-ED
Oxide-Thickness Determination in Thin-Insulator MOS Structures
- Bruno Ricco
- Piero Olivo
- et al.
- 1988
- IEEE T-ED
Measurement of MOSFET Channel Potential Profile
- Yew-Tong Yeow
- 1988
- IEEE T-ED
Identification and Implication of a Perimeter Tunneling Current Component in Advanced Self-Aligned Bipolar Transistors
- Hackbarth LI, Edward
- Tze Chiang Chen
- 1988
- IEEE T-ED
High-Field-Induced Degradation in Ultra-Thin SiO2 Films
- Piero Olivo
- Thao N. Nguyen
- et al.
- 1988
- IEEE T-ED
VA-6 Investigation of Stress Effects on the DC Characteristics of GaAs MESFET's Through the Use of Externally Applied Loads
- T.N. Jackson
- Jean-Claude Ramirez
- et al.
- 1987
- IEEE T-ED
On the Resistivity of TiSi2: The Implication for Low-Temperature Applications
- Lia Krusin-Elbaum
- Jack Yuan-Chen Sun
- et al.
- 1987
- IEEE T-ED
Nonideal Base Current in Bipolar Transistors at Low Temperatures
- Jason C. S. Woo
- James D. Plummer
- et al.
- 1987
- IEEE T-ED
Submicrometer-Channel CMOS for Low-Temperature Operation
- Jack Yuan-Chen Sun
- Yuan Taur
- et al.
- 1987
- IEEE T-ED