Syndrome-Testing of “Syndrome-Untestable” Combinational Circuits
- Jacob Savir
- 1981
- IEEE TC
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314 results at IEEE TC
The Weighted Syndrome Sums Approach to VLSI Testing
- Zeev Barzilai
- Jacob Savir
- et al.
- 1981
- IEEE TC
A Computation Model of Parallel Solution of Linear Equations
- Omar Wing
- John W. Huang
- 1980
- IEEE TC
Construction of a Generalized Connector with 5.8 n 1og2n Edges
- K.M. Chung
- C.K. Wong
- 1980
- IEEE TC
Syndrome-Testable Design of Combinational Circuits
- Jacob Savir
- 1980
- IEEE TC
An Experimental Delay Test Generator for LSI Logic
- Jean Davies Lesser
- John J. Shedletsky
- 1980
- IEEE TC
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
- Jacob Savir
- 1980
- IEEE TC
A Tradeoff Study of Switching Systems in Computer Communication Networks
- Parviz Kermani
- Leonard Kleinrock
- 1980
- IEEE TC
On the Complexity of Sortingin Magnetic Bubble Memory Systems
- Kin-Man Chung
- Fabrizio Luccio
- et al.
- 1980
- IEEE TC
A Tree Storage Scheme for Magnetic Bubble Memories
- K.M. Chung
- Fabrizio Luccio
- et al.
- 1980
- IEEE TC