Temporal and lateral electron pulse compression by a compact spherical electrostatic capacitor
- Krzysztof P. Grzelakowski
- Rudolf M. Tromp
- 2013
- Ultramicroscopy
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127 results at Ultramicroscopy
A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
- Rudolf M. Tromp
- James B. Hannon
- et al.
- 2013
- Ultramicroscopy
Microstructural changes in silicon induced by patterning with focused ion beams of Ga, Si and Au
- See Wee Chee
- Martin Kammler
- et al.
- 2013
- Ultramicroscopy
Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy
- Rudolf M. Tromp
- S.M. Schramm
- 2013
- Ultramicroscopy
Variable magnification dual lens electron holography for semiconductor junction profiling and strain mapping
- Y.Y. Wang
- J. Li
- et al.
- 2013
- Ultramicroscopy
Selected-area diffraction and spectroscopy in LEEM and PEEM
- R.M. Tromp
- 2012
- Ultramicroscopy
Aberrations of the cathode objective lens up to fifth order
- R.M. Tromp
- W. Wan
- et al.
- 2012
- Ultramicroscopy
A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM
- S.M. Schramm
- A.B. Pang
- et al.
- 2012
- Ultramicroscopy
Measuring and correcting aberrations of a cathode objective lens
- Rudolf M. Tromp
- 2011
- Ultramicroscopy
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
- R.M. Tromp
- James B. Hannon
- et al.
- 2010
- Ultramicroscopy