Characterization of fast relaxation during BTI stress in conventional and advanced CMOS devices with HfO2 gate stacks
- Andreas Kerber
- Kingsuk Maitra
- et al.
- 2008
- IEEE Transactions on Electron Devices
Publications
139 results at IEEE Transactions on Electron Devices
Integrating phase-change memory cell with Ge nanowire diode for crosspoint memory - Experimental demonstration and analysis
- SangBum Kim
- Yuan Zhang
- et al.
- 2008
- IEEE Transactions on Electron Devices
Optimal design of triple-gate devices for high-performance and low-power applications
- Meng-Hsueh Chiang
- Jeng-Nan Lin
- et al.
- 2008
- IEEE Transactions on Electron Devices
Methodology for small-signal model extraction of AlGaN HEMTs
- James R. Shealy
- Jiali Wang
- et al.
- 2008
- IEEE Transactions on Electron Devices
Investigation of thermal crosstalk between SOI FETs by the subthreshold sensing technique
- Manu Shamsa
- Paul M. Solomon
- et al.
- 2008
- IEEE Transactions on Electron Devices
Optimal dual-VT design in sub-100-nm PD/SOI and double-gate technologies
- Aditya Bansal
- Jae-Joon Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
A new method to determine effective lateral doping abruptness and spreading-resistance components in nanoscale MOSFETs
- Seong-Dong Kim
- Shreesh Narasimha
- et al.
- 2008
- IEEE Transactions on Electron Devices
Threshold voltage variation in SOI Schottky-barrier MOSFETs
- Min Zhang
- Joachim Knoch
- et al.
- 2008
- IEEE Transactions on Electron Devices
Device design and optimization methodology for leakage and variability reduction in sub-45-nm FD/SOI SRAM
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2008
- IEEE Transactions on Electron Devices
Improving the performance of superjunction devices having fixed charge in isolation and termination oxide layers
- S. Balaji
- Shreepad Karmalkar
- 2008
- IEEE Transactions on Electron Devices