Interface state capture cross section measurements on vacuum annealed and radiation damaged Si:SiO2 surfaces
- M.J. Uren
- V. Nayar
- et al.
- 1998
- JES
Publications
Date
Featured collections
Popular topics
509 results at JES
Use of SiBN and SiBON films prepared by plasma enhanced chemical vapor deposition from borazine as interconnection dielectrics
- W.F. Kone
- S. Cohen
- et al.
- 1997
- JES
Anisotropic etching of a novalak-based polymer at cryogenic temperature
- R. Hsiao
- K. Yu
- et al.
- 1997
- JES
Use of polyaniline and its derivatives in corrosion protection of copper and silver
- Vlasta Brusic
- Marie Angelopoulos
- et al.
- 1997
- JES
Nonlinear dynamics of limiting current in the flow-modulated uniform-injection cell
- J. Antonio Medina
- Daniel T. Schwarte
- 1997
- JES
High temperature reactive ion etching of indium-tin oxide
- Yue Kuo
- 1997
- JES
Repassivation of pits in aluminum thin films
- G.S. Frankel
- J.R. Scully
- et al.
- 1996
- JES
Effect of mask wall angle on shape evolution during through-mask electrochemical micromachining
- R.V. Shenoy
- M. Datta
- 1996
- JES
Horizontally redundant, split-gate a-Si:H thin film transistors
- Yue Kuo
- 1996
- JES
Wettability of polished silicon oxide surfaces
- Richard R. Thomas
- Frank B. Kaufman
- et al.
- 1996
- JES