Measuring and correcting aberrations of a cathode objective lens
- Rudolf M. Tromp
- 2011
- Ultramicroscopy
Publications
This is our catalog of publications authored by IBM researchers, in collaboration with the global research community. It’s an ever-growing body of work that shows why IBM is one of the most important contributors to modern computing.
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126 results at Ultramicroscopy
A new aberration-corrected, energy-filtered LEEM/PEEM instrument. I. Principles and design
- R.M. Tromp
- James B. Hannon
- et al.
- 2010
- Ultramicroscopy
Medipix 2 detector applied to low energy electron microscopy
- R. van Gastel
- I. Sikharulidze
- et al.
- 2009
- Ultramicroscopy
Characterizing probe performance in the aberration corrected STEM
- P.E. Batson
- 2006
- Ultramicroscopy
A cantilever array-based artificial nose
- M.K. Baller
- H.P. Lang
- et al.
- 2000
- Ultramicroscopy
Towards quantitative electron holography of magnetic thin films using in situ magnetization reversal
- R.E. Dunin-Borkowski
- M.R. McCartney
- et al.
- 1998
- Ultramicroscopy
Implications of high resolution to near-field optical microscopy
- Lukas Novotny
- Bert Hecht
- et al.
- 1998
- Ultramicroscopy
Greatly defocused, point-projection, off-axis electron holography
- J.M. Cowley
- M. Mankos
- et al.
- 1996
- Ultramicroscopy
Near-field, far-field and imaging properties of the 2D aperture SNOM
- L. Novotny
- D. Pohl
- et al.
- 1995
- Ultramicroscopy
Piezoresistive cantilevers as optical sensors for scanning near-field microscopy
- P. Bauer
- B. Hecht
- et al.
- 1995
- Ultramicroscopy