Low Temperature Atmospheric Pressure Chemical Vapor Deposition for Epitaxial Growth of SiGe Bipolar TransistorsD.A. GrutzmacherD.A. Grutzmacher1995JES
Repassivation Transients Measured with the Breaking-Electrode Technique on Aluminum Thin-Film SamplesC.V. JahnesV. Brusicet al.1995JES
Electrochemical Fabrication of Mechanically Robust PbSn C4 InterconnectionsJ. RoederH. Deligianniet al.1995JES
PECVD Silicon Nitride as a Gate Dielectric for Amorphous Silicon Thin Film Transistor Process and Device PerformanceYue Kuo1995JES