PECVD Silicon Nitride as a Gate Dielectric for Amorphous Silicon Thin Film Transistor Process and Device PerformanceYue Kuo1995JES
Low Temperature Atmospheric Pressure Chemical Vapor Deposition for Epitaxial Growth of SiGe Bipolar TransistorsD.A. GrutzmacherD.A. Grutzmacher1995JES
Repassivation Transients Measured with the Breaking-Electrode Technique on Aluminum Thin-Film SamplesC.V. JahnesV. Brusicet al.1995JES
Laser-Assisted Seeding for Electroless Plating on Polyimide SurfacesA.G. SchrottBodil Brarenet al.1995JES
Electrochemical Fabrication of Mechanically Robust PbSn C4 InterconnectionsJ. RoederH. Deligianniet al.1995JES