Identifying and Removing Artifacts Formed During FIB TEM Sample Preparation of Semiconductor Devices
- Lynne Gignac
- John Bruley
- et al.
- 2025
- AReMS 2025
Publications
24821 results for Exploratory Science
Edge Classification on Graphs: New Directions in Topological Imbalance
- Xueqi Cheng
- Yu Wang
- et al.
- 2025
- WSDM 2025
Foundation models for materials discovery – current state and future directions
- Edward O. Pyzer-Knapp
- Matteo Manica
- et al.
- 2025
- npj Computational Materials
High-Efficiency Continuous Spin-Conduction through NiO/Cu Bilayer Structure
- Biswajit Sahoo
- Christopher Safranski
- et al.
- 2025
- Nano Letters
New bounds for the number of lightest cycles in undirected graphs
- Hassene Aissi
- Mourad Baiou
- et al.
- 2025
- Information Processing Letters
Enterprise Class Modular Cache Hierarchy
- Craig Walters
- Deanna Berger
- et al.
- 2025
- HPCA 2025
Quantifying the Bit-Error Resilience of FHE Compute
- Augusto Vega
- Matías Mazzanti
- et al.
- 2025
- HPCA 2025
Defects induce phase transition from dynamic to static rippling in graphene
- Fabian Thiemann
- Camille Scalliet
- et al.
- 2025
- PNAS
DiffuseKronA: A Parameter Efficient Fine-tuning Method for Personalized Diffusion Models
- Shyam Marjit
- Harshit Singh
- et al.
- 2025
- WACV 2025
SODA: Spectral Orthogonal Decomposition Adaptation for Diffusion Models
- Xinxi Zhang
- Song Wen
- et al.
- 2025
- WACV 2025