Measurement of the flux and energy spectrum of cosmic-ray induced neutrons on the ground
- M. Gordon
- P. Goldhagen
- et al.
- 2004
- IEEE TNS
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Charge trapping and annealing in high-k gate dielectrics
- James A. Felix
- Marty R. Shaneyfelt
- et al.
- 2004
- IEEE TNS
SEMM-2: A modeling system for single event upset analysis
- Henry H. K. Tang
- Ethan H. Cannon
- 2004
- IEEE TNS
Proton radiation response of monolithic millimeter-wave transceiver building blocks implemented in 200 GHz SiGe technology
- Wei-Min Lance Kuo
- Yuan Lu
- et al.
- 2004
- IEEE TNS
Radiation-Induced Charge Trapping in Thin Al2O 3/SiOxNy/Si(100) Gate Dielectric Stacks
- J.A. Felix
- M.R. Shaneyfelt
- et al.
- 2003
- IEEE TNS
Terrestrial Thermal Neutrons
- John D. Dirk
- Martin E. Nelson
- et al.
- 2003
- IEEE TNS
Radiation effects in low dielectric constant methyl-silsesquioxane films
- Mihail P. Petkov
- Kelvin G. Lynn
- et al.
- 2002
- IEEE TNS
Proton radiation response of SiGe HBT analog and RF circuits and passives
- John D. Cressler
- Michael C. Hamilton
- et al.
- 2001
- IEEE TNS
Theoretical determination of the temporal and spatial structure of α-particle induced electron-hole pair generation in silicon
- Phil Oldiges
- Robert Dennard
- et al.
- 2000
- IEEE TNS
Pion-induced soft upsets in 16 Mbit DRAM chips
- C.J. Gelderloos
- R.J. Peterson
- et al.
- 1997
- IEEE TNS