Applying recursion to serial and parallel QR factorization leads to better performance
- E. Elmroth
- F.G. Gustavson
- 2000
- IBM J. Res. Dev
Publications
745 results at IBM J. Res. Dev
Scanning tunneling microscopy
- G. Binnig
- H. Rohrer
- 2000
- IBM J. Res. Dev
Future of CMOS technology
- Randall D. Isaac
- 2000
- IBM J. Res. Dev
Low-energy electron microscopy
- Rudolf M. Tromp
- 2000
- IBM J. Res. Dev
Reduction of electromigration in aluminum films by copper doping
- Irving Ames
- Francois M. D'Heurle
- et al.
- 2000
- IBM J. Res. Dev
Electronic displays for information technology
- Robert L. Wisnieff
- J.J. Ritsko
- 2000
- IBM J. Res. Dev
Application of RF Discharges to sputtering
- H.R. Koenig
- L.I. Maissei
- 2000
- IBM J. Res. Dev
Custom circuit design as a driver of microprocessor performance
- David H. Allen
- Sang H. Dhong
- et al.
- 2000
- IBM J. Res. Dev
Controlled collapse reflow chip joining
- Lewis F. Miller
- 2000
- IBM J. Res. Dev
Characterization of silicon surface preparation processes for advanced gate dielectrics
- H. Okorn-Schmidt
- 1999
- IBM J. Res. Dev