Properties of reactively sputtered tungsten films in nitrogen and oxygen
- K.Y. Ahn
- S.B. Brodskv
- et al.
- 1986
- JVSTA
Publications
176 results at JVSTA
Contact and metallization problems in GaAs integrated circuits
- N. Braslau
- 1986
- JVSTA
Properties of Cr-N films produced by reactive sputtering
- K.K. Shih
- D.B. Dove
- et al.
- 1986
- JVSTA
Summary Abstract: The hexagonal reconstruction of Pt(100): A scanning tunneling microscopy study
- R.J. Behm
- W. Hösier
- et al.
- 1986
- JVSTA
Time and angle resolved ultraviolet photoemission spectroscopy studies of single crystal surface and interfaces
- J. Bokor
- R.R. Freeman
- et al.
- 1986
- JVSTA
The atomic structure of the NiSi2~Si(111) interface
- E.J. van Loenen
- 1986
- JVSTA
Characterization of nitrogen-containing glasses by x-ray photoelectron spectroscopy
- G.H. Frischat
- R. Fern
- 1986
- JVSTA
Thin films for magnetic recording technology: A review
- J.K. Howard
- 1986
- JVSTA
Scanning tunneling microscopy studies of Si(111)-2x 1 surfaces
- R.M. Feenstra
- W.A. Thompson
- et al.
- 1986
- JVSTA
Summary Abstract: Diagnostics in plasma processing
- J.W. Coburn
- 1986
- JVSTA