Silicide precipitation and silicon crystallization in nickel implanted amorphous silicon thin films
- R.C. Cammarata
- C.V. Thompson
- et al.
- 2011
- Journal of Materials Research
Publications
3512 results for Materials Discovery
Tensile fracture and fractographic analysis of 1045 spheroidized steel under hydrostatic pressure
- A.S. Kao
- W.A. Spitzig
- et al.
- 2011
- Journal of Materials Research
Stress gradients observed in Cu thin films induced by capping layers
- Conal E. Murray
- Paul R. Besser
- et al.
- 2011
- Journal of Materials Research
Microstructure and Conversion Electron Mossbauer Studies of M Decrease in Fe3O4 Films
- C. ortiz
- C. Hwang
- et al.
- 2011
- Journal of Materials Research
Electrical resistance of metallic contacts on silicon and germanium during indentation
- T.R. Dinger
- D.R. Clarke
- 2011
- Journal of Materials Research
Instrumentation of A Conventional Hardness Tester for Load-Displacement Measurement During Indentation
- R.F. Cook
- 2011
- Journal of Materials Research
The effect of lateral crack growth on the strength of contact flaws in brittle materials
- Robert F. Cook
- David H. Roach
- 2011
- Journal of Materials Research
An investigation of hardness and adhesion of sputter-deposited aluminum on silicon by utilizing a continuous indentation test
- D. Stone
- W.R. LaFontaine
- et al.
- 2011
- Journal of Materials Research
Epitaxial growth of C60 thin films on mica
- W. Krakow
- N.M. Rivera
- et al.
- 2011
- Journal of Materials Research
Thin-film interactions and their relevance to electronic packaging
- Chin-An Chang
- 2011
- Journal of Materials Research