Study of titanium nitride underlayer properties and its influence on tungsten growthShanti PancharatnamJ. Wynneet al.2018ASMC 2018
Gas cluster ion beam processing for improved self aligned contact yield at 7 nm node FinFET: MJ: MOL and junction interfacesSu Chen FanSean Teehanet al.2018ASMC 2018
Method of problem solving to diagnose high particle failures due to unique rotation stopping position: CFM: Contamination free manufacturingJessica Gruss-GiffordT. Haighet al.2018ASMC 2018
Particle reduction in back end of line plasma-etching process: CFM: Contamination free manufacturingLijuan ZouAlex Vagheseet al.2018ASMC 2018
Ring oscillator yield learning methodologies for CMOS technology researchVictor ChanD. Leaet al.2018ASMC 2018