Characterization of the VT-instability in SiO2 / HfO2 gate dielectrics
- A. Kerber
- E. Cartier
- et al.
- 2003
- IRPS 2003
Publications
Date
Featured collections
Popular topics
11 results at IRPS 2003
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- Stas Polonsky
- Andrei Talalaevskii
- et al.
- 2003
- IRPS 2003
Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Growth and scaling of oxide conduction after breakdown
- Barry P. Linder
- James H. Stathis
- et al.
- 2003
- IRPS 2003
Growth and scaling of oxide conduction after breakdown
- Barry P. Linder
- James H. Stathis
- et al.
- 2003
- IRPS 2003
Characterization of the VT-instability in SIO2/HFO2 gate dielectrics
- A. Kerber
- E. Cartier
- et al.
- 2003
- IRPS 2003
Modeling and experimental verification of the effect of gate oxide breakdown on CMOS inverters
- R. Rodríguez
- J.H. Stathis
- et al.
- 2003
- IRPS 2003
Characterization of light emission from SiGe heterojunction bipolar transistor for photon emission microscopy applications
- Stas Polonsky
- Andrei Talalaevskii
- et al.
- 2003
- IRPS 2003
Sige HBT performance and reliability trends through fT of 350GHz
- Greg Freeman
- Jae-Sung Rieh
- et al.
- 2003
- IRPS 2003