Modeling and analysis of total leakage currents in nanoscale double gate devices and circuitsSaibal MukhopadhyayKeunwoo Kimet al.2005ISLPED 2005
Improving energy efficiency by making DRAM less randomly accessedHai HuangKang G. Shinet al.2005ISLPED 2005
Power and thermal effects of SRAM vs. latch-mux design styles and clock gating choicesYingmin LiMark Hempsteadet al.2005ISLPED 2005