TSV/FET proximity study using dense addressable transistor arrays
- Raphael P. Robertazzi
- Kanak Agarwal
- et al.
- 2015
- IRPS 2015
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15 results at IRPS 2015
SOI FinFET soft error upset susceptibility and analysis
- Phil Oldiges
- Ken Rodbell
- et al.
- 2015
- IRPS 2015
Phase-change memory: Feasibility of reliable multilevel-cell storage and retention at elevated temperatures
- Milos Stanisavljevic
- A. Athmanathan
- et al.
- 2015
- IRPS 2015
A collective relaxation model for resistance drift in phase change memory cells
- Abu Sebastian
- Daniel Krebs
- et al.
- 2015
- IRPS 2015
A case study of electromigration reliability: From design point to system operations
- Baozhen Li
- Paul Muller
- et al.
- 2015
- IRPS 2015
Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET
- Miaomiao Wang
- Zuoguang Liu
- et al.
- 2015
- IRPS 2015
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology
- Pong-Fei Lu
- Keith A. Jenkins
- et al.
- 2015
- IRPS 2015
Time-integrated photon emission as a function of temperature in 32 nm CMOS
- Andrea Bahgat Shehata
- Alan J. Weger
- et al.
- 2015
- IRPS 2015
Analyzing path delays for accelerated testing of logic chips
- Emily Ray
- Barry P. Linder
- et al.
- 2015
- IRPS 2015
Non-volatile memory as hardware synapse in neuromorphic computing: A first look at reliability issues
- Robert M. Shelby
- Geoffrey W. Burr
- et al.
- 2015
- IRPS 2015