Interconnects exhibiting enhanced electromigration short-length effects by line width variation
- Ronald Filippi
- P.-C. Wang
- et al.
- 2014
- IRPS 2014
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9 results at IRPS 2014
The impact of Hot Carrier Injection (HCI) on voltage control oscillator lifetime prediction
- Chih-Hsiang Ho
- Keith A. Jenkins
- et al.
- 2014
- IRPS 2014
TDDB at low voltages: An electrochemical perspective
- Ramachandran Muralidhar
- Thomas M. Shaw
- et al.
- 2014
- IRPS 2014
Combined ramp voltage stress and constant voltage stress for optimal BTI voltage acceleration and lifetime modeling
- Barry P. Linder
- Takashi Ando
- 2014
- IRPS 2014
Process dependence of AC/DC PBTI in HKMG n-MOSFETs
- Wen Liu
- Giuseppe La Rosa
- et al.
- 2014
- IRPS 2014
Cross-layer system resilience at affordable power
- Meeta S. Gupta
- Jude A. Rivers
- et al.
- 2014
- IRPS 2014
Low-field TDDB reliability data to enable accurate lifetime predictions
- Eric G. Liniger
- Stephan A. Cohen
- et al.
- 2014
- IRPS 2014
Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities
- Ernest Y. Wu
- Baozhen Li
- et al.
- 2014
- IRPS 2014
Modeling of transient and static components of intrinsic emission from VLSI circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- IRPS 2014