The effect of ESD on the performance of magnetic storage drivesIcko Eric Timothy IbenGilda Leeet al.2010EOS/ESD 2010
Pulsed gate dielectric breakdown in a 32 nm technology under different ESD stress configurationsYang YangRobert Gauthieret al.2010EOS/ESD 2010
Predictive full circuit ESD simulation and analysis using extended ESD compact models: Methodology and tool implementationJunjun LiRobert Gauthieret al.2010EOS/ESD 2010