Hole transport in p-channel Si MOSFETs
- Santhosh Krishnan
- Dragica Vasileska
- et al.
- 2005
- Microelectronics Journal
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8 results at Microelectronics Journal
Assessment of structure variation in silicon nanowire FETs and impact on SRAM
- Yi-Bo Liao
- Meng-Hsueh Chiang
- et al.
- 2012
- Microelectronics Journal
Comparison of transient and static test methods for chip-to-sink thermal interface characterization
- B. Smith
- T. Brunschwiler
- et al.
- 2009
- Microelectronics Journal
Reducing parasitic BJT effects in partially depleted SOI digital logic circuits
- Koushik K. Das
- Ching-Te Chuang
- et al.
- 2008
- Microelectronics Journal
Estimation of gate-to-channel tunneling current in ultra-thin oxide sub-50 nm double gate devices
- Saibal Mukhopadhyay
- Keunwoo Kim
- et al.
- 2007
- Microelectronics Journal
Reading the footprints of strained islands
- A. Rastelli
- M. Stoffel
- et al.
- 2006
- Microelectronics Journal
Quasi-bound states and resonances in heterostructures
- P.J. Price
- 1999
- Microelectronics Journal
Role of molecular beam epitaxy in the field of optoelectronics
- Heinz P. Meier
- M. Kamp
- et al.
- 1994
- Microelectronics Journal