X-ray diffraction studies of thin films and multilayer structures
- Armin Segmüller
- I.C. Noyan
- et al.
- 1989
- Progress In Crystal Growth And Characterization
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Developments in crystal growth from high-temperature solutions
- Hans J. Scheel
- 1982
- Progress In Crystal Growth And Characterization
Semiconductor superlattices by MBE and their characterization
- L.L. Chang
- L. Esaki
- 1979
- Progress In Crystal Growth And Characterization